Testing Systems
Burn-in Test Jig, view 1
Burn-in Test Jig, view 2
Burn-in Test Jig, view 3
Burn-in Test Jig, view 4
Testing Systems

Burn-in Test Jig

Our Burn-in Test Jigs subject electronic components and assemblies to elevated temperature and voltage stress over extended periods, exposing latent defects that would otherwise surface in the field. Custom-designed for your specific product, each jig includes precise temperature monitoring, overcurrent protection, and multi-unit parallel testing capability.

TypeBurn-in Test Jig
Test MethodAccelerated Life / Stress Testing
MonitoringTemperature & Current
ConfigurationMulti-Unit Parallel
Country of OriginMade in India

Key Features

Accelerated Stress Testing: Subjects components to elevated temperature and voltage to expose latent defects before field deployment.
Multi-Unit Parallel Testing: Tests multiple units simultaneously to maximize throughput during burn-in cycles.
Temperature Monitoring: Integrated thermal sensors ensure precise temperature control throughout the burn-in process.
Overcurrent Protection: Built-in safety circuits protect both the test jig and the device under test from electrical faults.

Applications

  • Power Supply Burn-in
  • PCB Assembly Stress Testing
  • LED Driver Validation
  • Semiconductor Screening
  • Motor Controller Testing

Industries Served

ElectronicsAutomotivePower ElectronicsDefenceTelecommunications

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