Testing Systems







Testing Systems
Burn-in Test Jig
Our Burn-in Test Jigs subject electronic components and assemblies to elevated temperature and voltage stress over extended periods, exposing latent defects that would otherwise surface in the field. Custom-designed for your specific product, each jig includes precise temperature monitoring, overcurrent protection, and multi-unit parallel testing capability.
TypeBurn-in Test Jig
Test MethodAccelerated Life / Stress Testing
MonitoringTemperature & Current
ConfigurationMulti-Unit Parallel
Country of OriginMade in India
Key Features
Accelerated Stress Testing: Subjects components to elevated temperature and voltage to expose latent defects before field deployment.
Multi-Unit Parallel Testing: Tests multiple units simultaneously to maximize throughput during burn-in cycles.
Temperature Monitoring: Integrated thermal sensors ensure precise temperature control throughout the burn-in process.
Overcurrent Protection: Built-in safety circuits protect both the test jig and the device under test from electrical faults.
Applications
- Power Supply Burn-in
- PCB Assembly Stress Testing
- LED Driver Validation
- Semiconductor Screening
- Motor Controller Testing
Industries Served
ElectronicsAutomotivePower ElectronicsDefenceTelecommunications
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